Gokhan’s JAP is published:
Extraction of temperature dependent electrical resistivity and thermal conductivity from silicon microwires self-heated to melting temperature, J. Appl. Phys. 112, 063527 (2012) (pdf copy)
Gokhan’s JAP is published:
Extraction of temperature dependent electrical resistivity and thermal conductivity from silicon microwires self-heated to melting temperature, J. Appl. Phys. 112, 063527 (2012) (pdf copy)
Two recent publications from the lab:
Nanoscale RingFETs in Electron Device Letters
Finite element analysis of scaling of silicon micro-thermoelectric generators to nanowire dimensions in Journal of Renewable and Sustainable Energy
Our work on thermoelectric effects in self-heating Si wires (appeared as an invited feature paper in Journal of Material Research): Self-heating of silicon microwires: Crystallization and thermoelectric effects
Senior undergraduates have designed and built a high-temperature Seebeck measurement setup making use of a commercial induction heater and mechanical pencils.