Our work on asymmetric self-heating of silicon microwires work is published in Nature Scientific Reports (open access), please check it out:
Nadim’s “Computational Analysis of Rupture Oxide Phase Change Memory Cells”, IEEE Trans. on Electron Devices 60, 5, 1649 – 1655 (2013) 10.1109/TED.2013.2255130.
Kadir’s “Assisted cubic to hexagonal phase transition in GeSbTe thin films on silicon nitride,” Thin Solid Films, available online April 2013; http://dx.doi.org/10.1016/j.tsf.2013.03.087.
and Sean’s “Percolation transport and filament formation in nanocrystalline silicon nanowires,” Journal of Applied Physics, 113, 164902 (2013) http://jap.aip.org/resource/1/japiau/v113/i16/p164902_s1
New publication, Kadir as the first author in IEEE Transactions on Electron Devices:
Electrical Resistivity of Liquid Ge2Sb2Te5 Based on Thin-Film and Nanoscale Device Measurements. IEEE TED, v. 60, issue 1, pp. 433-437 (2013)
Gokhan’s JAP is published:
Azer and Nick presented their poster at the 2012 IEEE Device Research Conference (Penn State, June 18-20):
A. Faraclas, N. Williams, A. Gokirmak, H. Silva, “Comparison of Instantaneous Crystallization and Metastable Models in Phase Change Memory Cells,” 2012 IEEE Device Research Conference (2012).
Undergraduate students Rebecca Nowak, Lingyi Zhang, Jonathan Rarey, Tom Capuano and Michael Trombetta joined our lab for the summer. (NSF REU Program).
APS March Meeting in Boston:
L. Lucera, L. Adnane, K. Cil, V. Manthina, A. Agrios, H. Silva, A. Gokirmak, Light emission from electrically stressed ZnO nanorods, Americal Physical Society March Meeting 2012, http://meetings.aps.org/link/BAPS.2012.MAR.L28.14 (2012).
L. Adnane, F. Dirisaglik, M. Akbulut, Y. Zhu, C. Lam, A. Gokirmak, H. Silva, High Temperature Seebeck Coefficient and Electrical Resistivity of GeSbTe Thin Films, Americal Physical Society March Meeting 2012, http://meetings.aps.org/link/BAPS.2012.MAR.Q28.6 (2012).
Modeling of Set and Reset Operations of Phase-Change Memory Cells in EDL IEEE (undergraduate student work).
Scaling of Silicon Phase-Change Oscillators in EDL IEEE.
The list of our oral and poster presentations to be delivered in MRS Fall 2011 in Boston, MA:
S. Fischer, N. E. Williams, C. Osorio, A. Gokirmak, H. Silva, “Finite Element Simulations of Current-Induced Filamentations in Nanocrystalline Silicon,” Mat. Res. Soc. Fall Meeting, vol. BB20.2, 2011. (undergraduate student work)
M. Wennberg, A. King, A. Cywar, F. Dirisaglik, A. Gokirmak, H. Silva, “Nanosecond voltage pulsing and DC voltage sweeping on nano-scale Ge2Sb2Te5wires,” Mat. Res. Soc. Fall Meeting, vol. BB4.6, 2011. (undergraduate student work)
G. Bakan, A. Gokirmak, H. Silva, “Thermoelectric Transport under Large Temperature Gradients in Self-Heated Silicon Microwires,” Mat. Res. Soc. Fall Meeting, vol. W6.10, 2011.
K. Cil, Y. Zhu, C. Lam, H. Silva, “The Effect of Substrate and Film Thickness on Phase Transition Temperatures of GST Thin Films,” Mat. Res. Soc. Fall Meeting, vol. SS7.54, 2011.
L. Adnane, N. E. Williams, A. Gokirmak, H. Silva, “High Temperature Seebeck Coefficient and Resistivity Measurement Setup,” Mat. Res. Soc. Fall Meeting, vol. O8.12, 2011.
N. Khan, G. Bakan, A. Gokirmak and H. Silva, “Analysis of Light Emission from Self-Heated Nanocrystalline Silicon Microwires,” Mat. Res. Soc. Fall Meeting, vol. W7.5, 2011.
N. E. Williams, A. Gokirmak and H. Silva, “Finite Element Simulations on Scaling Effects of Thermoelectric Generators,” Mat. Res. Soc. Fall Meeting, vol. F4.1, 2011.
Our work on thermoelectric effects in self-heating Si wires (appeared as an invited feature paper in Journal of Material Research): Self-heating of silicon microwires: Crystallization and thermoelectric effects
Our recent work on microscale nanosecond pulse generators is published in IEEE Electron Device Letters
Senior undergraduates have designed and built a high-temperature Seebeck measurement setup making use of a commercial induction heater and mechanical pencils.
Following talks have been given at MRS Spring 2010 meeting in San Francisco:
1. M. Akbulut, “Controlling Peripheral Leakage Currents in Ultra-narrow MOSFETs Using a Penta-Gate Approach,” I2.7, on April 7, 2010.
2. A. Cywar, “Electromigration of Liquid Silicon in Nanocrystalline Silicon Microwires During Phase-change Oscillations,” A8.5, on April 7, 2010.
3. A. Gokirmak, “Growth from Melt and Phase Change Oscillations in Silicon Micro- and Nano-wires,” P13.17, on April 8, 2010.
4. N. Williams, “Temperature Dependent Electrical Characterization and Crystallization of Nanocrystalline Silicon,” A17.9, on April 8, 2010.
Ali Gokirmak received Uconn ECE teaching excellence award
Our recent publication on making use of ambient noise in C-V measurements with aF resolution was featured on Nanotechnology news.
We will be delivering 4 talks and presenting 2 posters at MRS Fall 2009 Meeting in Boston:
1. A. Gokirmak, “Crystallization of Patterned Nanocrystalline Micro-structures Through Self-heating,” C2.3, on December 30, 2009.
2. M. Akbulut, “Electrostatic Passivation of Peripheral Interface Trap Charges and Electrostatic Doping in Accumulated Body Transistors,” A5.5, on November 30, 2009.
3. G. Bakan, “Optical Observations of Strong Thermoelectric Thomson Effect on Self-heated Nanocrystalline Silicon Microwires,”CC1.5, on November 30, 2009.
4. G. Bakan, “Electrical Conduction and Heat Transfer Simulations of Nanocrystalline Silicon Microwires Including the Thermoelectric Thomson Effect,” LL5.22, on December 1, 2009.
5. A. Cywar, “Rapid Solid-Liquid Phase-Change Oscillations in Nanocrystalline Silicon Wires,” MM7.7, on December 2, 2009.
6. H.Silva, “Electron-phonon Interactions in Silicon Microwires under Extreme Electrical Stress,” Z6.2, on December 2, 2009.